test_SWD_key_and_reserved_pad_signal_rejected_and_head_pin7_required (test_connector_review.Connectors.test_SWD_key_and_reserved_pad_signal_rejected_and_head_pin7_required) ... ok
test_catalog_identity_key_count_mount_pitch_and_source_mutations_refused (test_connector_review.Connectors.test_catalog_identity_key_count_mount_pitch_and_source_mutations_refused) ... ok
test_current_inventory_quantity_and_explicit_order_codes (test_connector_review.Connectors.test_current_inventory_quantity_and_explicit_order_codes) ... ok
test_explicit_existing_mpn_preserved_and_alias_is_scoped (test_connector_review.Connectors.test_explicit_existing_mpn_preserved_and_alias_is_scoped) ... ok
test_five_revised_drills_never_become_manufacturing_approval (test_connector_review.Connectors.test_five_revised_drills_never_become_manufacturing_approval) ... ok
test_native_grid_pitch_and_mount_mutations_refused (test_connector_review.Connectors.test_native_grid_pitch_and_mount_mutations_refused) ... ok
test_native_missing_duplicate_swapped_power_and_mount_signal_refused (test_connector_review.Connectors.test_native_missing_duplicate_swapped_power_and_mount_signal_refused) ... ok
test_selection_coverage_duplicates_and_default_shunts (test_connector_review.Connectors.test_selection_coverage_duplicates_and_default_shunts) ... ok
test_actual_crystal_land_pattern_and_reject_wrong_shape_size_or_network (test_crystal_and_caps.CrystalAndCaps.test_actual_crystal_land_pattern_and_reject_wrong_shape_size_or_network) ... ok
test_initial_load_model_never_approves_unmeasured_stray_or_frequency (test_crystal_and_caps.CrystalAndCaps.test_initial_load_model_never_approves_unmeasured_stray_or_frequency) ... ok
test_nominal_29_new_refs_and_physical_approvals_still_blank (test_crystal_and_caps.CrystalAndCaps.test_nominal_29_new_refs_and_physical_approvals_still_blank) ... ok
test_scoped_MLCC_no_wrong_voltage_dielectric_case_context_or_frozen_MPN (test_crystal_and_caps.CrystalAndCaps.test_scoped_MLCC_no_wrong_voltage_dielectric_case_context_or_frozen_MPN) ... ok
test_actual_land_patterns_reject_old_geometry_size_and_polarity (test_final_parts.FinalParts.test_actual_land_patterns_reject_old_geometry_size_and_polarity) ... ok
test_ferrite_led_pulse_constraints_frozen_parts_and_ambiguity (test_final_parts.FinalParts.test_ferrite_led_pulse_constraints_frozen_parts_and_ambiguity) ... ok
test_charge_integral_is_not_qualified_pulse_withstand (test_fuse_review.FuseReview.test_charge_integral_is_not_qualified_pulse_withstand) ... ok
test_two_nominal_fuses_geometry_and_source_MPN_still_blank (test_fuse_review.FuseReview.test_two_nominal_fuses_geometry_and_source_MPN_still_blank) ... ok
test_wrong_current_temperature_slow_part_context_and_frozen_MPN_refused (test_fuse_review.FuseReview.test_wrong_current_temperature_slow_part_context_and_frozen_MPN_refused) ... ok
test_actual_endpoint_quantities_and_no_double_order (test_harness_prepare.Harness.test_actual_endpoint_quantities_and_no_double_order) ... ok
test_zero_changed_regional_spares_plan_and_invalid_boolean (test_harness_prepare.Harness.test_zero_changed_regional_spares_plan_and_invalid_boolean) ... ok
test_100V_and_reservoir_native_scope_reject_wrong_case_voltage_dielectric_temperature_and_frozen_part (test_input_capacitors.InputCaps.test_100V_and_reservoir_native_scope_reject_wrong_case_voltage_dielectric_temperature_and_frozen_part) ... ok
test_pulse_charge_budget_includes_source_credit_ESR_and_refuses_invalid_inputs_without_approval (test_input_capacitors.InputCaps.test_pulse_charge_budget_includes_source_credit_ESR_and_refuses_invalid_inputs_without_approval) ... ok
test_explicit_power_floor_wrong_footprint_and_native_nets_cannot_be_dropped (test_loaded_bias.LoadedBias.test_explicit_power_floor_wrong_footprint_and_native_nets_cannot_be_dropped) ... ok
test_loaded_solution_obeys_KCL_and_rejects_asymmetry_aging_and_overload (test_loaded_bias.LoadedBias.test_loaded_solution_obeys_KCL_and_rejects_asymmetry_aging_and_overload) ... ok
test_three_actual_native_reflow_rectangles_and_changed_resistor_context (test_loaded_bias.LoadedBias.test_three_actual_native_reflow_rectangles_and_changed_resistor_context) ... ok
test_changed_AF_or_MCU_native_signal_refuses_previous_review (test_mcu_binding_review.Binding.test_changed_AF_or_MCU_native_signal_refuses_previous_review) ... ok
test_scoped_actual_bindings_do_not_approve_hardware (test_mcu_binding_review.Binding.test_scoped_actual_bindings_do_not_approve_hardware) ... ok
test_actual_five_header_changes_and_bad_hole_or_pad_rejected (test_native_contract.NativeCAD.test_actual_five_header_changes_and_bad_hole_or_pad_rejected) ... ok
test_actual_schematic_export_RUN_1_NC_2_GND_3 (test_native_contract.NativeCAD.test_actual_schematic_export_RUN_1_NC_2_GND_3) ... ok
test_native_report_issues_rejected_even_if_CLI_returned_zero (test_native_contract.NativeCAD.test_native_report_issues_rejected_even_if_CLI_returned_zero) ... ok
test_project_rules_preserved_bytes_for_all_boards (test_native_contract.NativeCAD.test_project_rules_preserved_bytes_for_all_boards) ... ok
test_changed_pad_width_center_and_rotation_refused (test_power_geometry.PowerPads.test_changed_pad_width_center_and_rotation_refused) ... ok
test_three_native_pad_patterns_against_manufacturer_geometry (test_power_geometry.PowerPads.test_three_native_pad_patterns_against_manufacturer_geometry) ... ok
test_DI_bound_and_feedback_are_conditional_not_physical_approval (test_power_selection.PowerSelection.test_DI_bound_and_feedback_are_conditional_not_physical_approval) ... ok
test_current_five_refs_close_without_changing_quantity_or_approvals (test_power_selection.PowerSelection.test_current_five_refs_close_without_changing_quantity_or_approvals) ... ok
test_dual_termination_680_bias_fails_even_without_noise_and_overloading_refused (test_power_selection.PowerSelection.test_dual_termination_680_bias_fails_even_without_noise_and_overloading_refused) ... ok
test_power_rating_wrong_native_context_and_frozen_other_part_refused (test_power_selection.PowerSelection.test_power_rating_wrong_native_context_and_frozen_other_part_refused) ... ok
test_CLI_refuses_overwrite_and_input_is_read_only (test_prepare_samples.Readiness.test_CLI_refuses_overwrite_and_input_is_read_only) ... ok
test_actual_board_inventory_and_independently_counted_required_quantity (test_prepare_samples.Readiness.test_actual_board_inventory_and_independently_counted_required_quantity) ... ok
test_actual_new_candidates_and_unresolved_470k_and_power_pulse_positions (test_prepare_samples.Readiness.test_actual_new_candidates_and_unresolved_470k_and_power_pulse_positions) ... ok
test_capacitor_wrong_dielectric_capacitance_voltage_case_and_NRND_refused (test_prepare_samples.Readiness.test_capacitor_wrong_dielectric_capacitance_voltage_case_and_NRND_refused) ... ok
test_catalog_conflict_and_existing_different_part_refused (test_prepare_samples.Readiness.test_catalog_conflict_and_existing_different_part_refused) ... ok
test_current_catalog_closes_exact_power_positions_without_changing_quantity (test_prepare_samples.Readiness.test_current_catalog_closes_exact_power_positions_without_changing_quantity) ... ok
test_duplicate_missing_value_footprint_and_DNP_bom_corruption_refused (test_prepare_samples.Readiness.test_duplicate_missing_value_footprint_and_DNP_bom_corruption_refused) ... ok
test_empty_mpn_different_specs_and_radio_variants_do_not_merge (test_prepare_samples.Readiness.test_empty_mpn_different_specs_and_radio_variants_do_not_merge) ... ok
test_identical_IC_value_and_MPN_is_a_declared_part_not_a_spec_placeholder (test_prepare_samples.Readiness.test_identical_IC_value_and_MPN_is_a_declared_part_not_a_spec_placeholder) ... ok
test_inductor_insufficient_current_wrong_inductance_shield_and_footprint_refused (test_prepare_samples.Readiness.test_inductor_insufficient_current_wrong_inductance_shield_and_footprint_refused) ... ok
test_invalid_or_boolean_or_extra_plan_count_refused (test_prepare_samples.Readiness.test_invalid_or_boolean_or_extra_plan_count_refused) ... ok
test_native_net_context_and_legacy_encoding_and_malformed_net (test_prepare_samples.Readiness.test_native_net_context_and_legacy_encoding_and_malformed_net) ... ok
test_precision_and_pulse_resistors_never_get_ordinary_RC_substitutions (test_prepare_samples.Readiness.test_precision_and_pulse_resistors_never_get_ordinary_RC_substitutions) ... ok
test_precision_tolerance_and_resistance_must_match_even_with_matching_text (test_prepare_samples.Readiness.test_precision_tolerance_and_resistance_must_match_even_with_matching_text) ... ok
test_regional_module_orders_cannot_inherit_EU_code_for_US (test_prepare_samples.Readiness.test_regional_module_orders_cannot_inherit_EU_code_for_US) ... ok
test_extra_load_wrong_pin_and_nominal_only_proposal_refused (test_vcap_review.VCAPReview.test_extra_load_wrong_pin_and_nominal_only_proposal_refused) ... ok
test_nominal_candidates_four_positions_and_power_description_current_rating (test_vcap_review.VCAPReview.test_nominal_candidates_four_positions_and_power_description_current_rating) ... ok
test_strict_ESR_frequency_and_capacity_failures_not_promoted_to_release (test_vcap_review.VCAPReview.test_strict_ESR_frequency_and_capacity_failures_not_promoted_to_release) ... ok
test_three_dedicated_native_nodes_and_no_generic_temperature_qualification (test_vcap_review.VCAPReview.test_three_dedicated_native_nodes_and_no_generic_temperature_qualification) ... ok

----------------------------------------------------------------------
Ran 55 tests in 14.074s

OK
